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1 Ergebnisse
1
Deuterium Effect on Stress-Induced Leakage Current:
Lin, Bo Chun
;
Cheng, Yih Chung
;
Chin, Albert
..
Japanese Journal of Applied Physics. 38 (1999) 4S - p. 2337 , 1999
Link:
https://doi.org/10.1143/jjap.38.2337
RT Journal T1 <Title>Deuterium Effect on Stress-Induced Leakage Current</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.38.2337&Exemplar=1&LAN=DE A1 Lin, Bo Chun A1 Cheng, Yih Chung A1 Chin, Albert A1 Wang, Tahui A1 Tsai, Chun PB IOP Publishing YR 1999 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 38 IS 4S SP 2337 LK http://dx.doi.org/https://doi.org/10.1143/jjap.38.2337 DO https://doi.org/10.1143/jjap.38.2337 SF ELIB - SuUB Bremen
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