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1 Ergebnisse
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Comparison of Breakdown Behavior in Electron-Irradiatedand ..:
Jo, Jungyol
;
Park, Jun
;
Shen, Zhi Yuan
...
Japanese Journal of Applied Physics. 39 (2000) 7S - p. 4660 , 2000
Link:
https://doi.org/10.1143/jjap.39.4660
RT Journal T1 <Title>Comparison of Breakdown Behavior in Electron-Irradiatedand Proton-Irradiated Silicon pn Junctions</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.39.4660&Exemplar=1&LAN=DE A1 Jo, Jungyol A1 Park, Jun A1 Shen, Zhi Yuan A1 Lee, Ho Sung A1 Lee, Jun Ho A1 Nishihara, Yoshiaki PB IOP Publishing YR 2000 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 39 IS 7S SP 4660 LK http://dx.doi.org/https://doi.org/10.1143/jjap.39.4660 DO https://doi.org/10.1143/jjap.39.4660 SF ELIB - SuUB Bremen
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