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1 Ergebnisse
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New Technique for the Thermal Resistance Measurement of Pow..:
Hwa-Mok Kim, Hwa-Mok Kim
;
Jin-Sik Yoon, Jin-Sik Yoon
;
Seung-Ho Lee, Seung-Ho Lee
...
Japanese Journal of Applied Physics. 39 (2000) 11A - p. L1087 , 2000
Link:
https://doi.org/10.1143/jjap.39.l1087
RT Journal T1
New Technique for the Thermal Resistance Measurement of Power Field Effect Transistors Using Cathodoluminescence
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.39.l1087&Exemplar=1&LAN=DE A1 Hwa-Mok Kim, Hwa-Mok Kim A1 Jin-Sik Yoon, Jin-Sik Yoon A1 Seung-Ho Lee, Seung-Ho Lee A1 Jae-Eung Oh, Jae-Eung Oh A1 Won-Sang Lee, Won-Sang Lee A1 Kye-Ik Chun, Kye-Ik Chun A1 Ki-Woong Chung, Ki-Woong Chung A1 Hae-Won Chung, Hae-Won Chung A1 Tae-Won Kang, Tae-Won Kang PB IOP Publishing YR 2000 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 39 IS 11A SP L1087 LK http://dx.doi.org/https://doi.org/10.1143/jjap.39.l1087 DO https://doi.org/10.1143/jjap.39.l1087 SF ELIB - SuUB Bremen
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