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1 Ergebnisse
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Laser-Scanning Probe Microscope Based Nanoprocessing of Ele..:
Lu, Yong-Feng
;
Hu, Bing
;
Mai, Zhi-Hong
...
Japanese Journal of Applied Physics. 40 (2001) 6S - p. 4395 , 2001
Link:
https://doi.org/10.1143/jjap.40.4395
RT Journal T1 <Title>Laser-Scanning Probe Microscope Based Nanoprocessing of Electronics Materials</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.40.4395&Exemplar=1&LAN=DE A1 Lu, Yong-Feng A1 Hu, Bing A1 Mai, Zhi-Hong A1 Wang, Wei-Jie A1 Chim, Wai-Kin A1 Chong, Tow-Chong PB IOP Publishing YR 2001 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 40 IS 6S SP 4395 LK http://dx.doi.org/https://doi.org/10.1143/jjap.40.4395 DO https://doi.org/10.1143/jjap.40.4395 SF ELIB - SuUB Bremen
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