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Mechanisms of Electrical Stress-Induced Degradation in H2/P..:

Jeong, Yunsik ; Nagashima, Dai ; Kuwano, Hiroshi..
Japanese Journal of Applied Physics.  41 (2002)  Part 1, No. 8 - p. 5042-5047 , 2002
Link: https://doi.org/10.1143/jjap.41.5042