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1 Ergebnisse
1
Temperature Effect on AlN/SiO2Gate pH-Ion-Sensitive Field-E..:
Chiang, Jung-Lung
;
Chen, Ying-Chung
;
Chou, Jung-Chuan
.
Japanese Journal of Applied Physics. 41 (2002) Part 1, No. 2A - p. 541-545 , 2002
Link:
https://doi.org/10.1143/jjap.41.541
RT Journal T1
Temperature Effect on AlN/SiO2Gate pH-Ion-Sensitive Field-Effect Transistor Devices
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.41.541&Exemplar=1&LAN=DE A1 Chiang, Jung-Lung A1 Chen, Ying-Chung A1 Chou, Jung-Chuan A1 Cheng, Chien-Chuan PB IOP Publishing YR 2002 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 41 IS Part 1, No. 2A SP 541 OP 545 LK http://dx.doi.org/https://doi.org/10.1143/jjap.41.541 DO https://doi.org/10.1143/jjap.41.541 SF ELIB - SuUB Bremen
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