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Spatial Profile Measurement Method of Absolute Detection Ef..:

Lee, Seishu ; Kondoh, Takashi ; Miura, Yukitoshi
Japanese Journal of Applied Physics.  41 (2002)  Part 1, No. 11A - p. 6574-6576 , 2002
Link: https://doi.org/10.1143/jjap.41.6574