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1 Ergebnisse
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Flash Memory Reliability: an Improvement Against Erratic Er..:
Chimenton, Andrea
;
Olivo, Piero
Japanese Journal of Applied Physics. 42 (2003) Part 1, No. 4B - p. 2025-2027 , 2003
Link:
https://doi.org/10.1143/jjap.42.2025
RT Journal T1 <Title>Flash Memory Reliability: an Improvement Against Erratic Erase Phenomena Using the Constant Charge Erasing Scheme</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.42.2025&Exemplar=1&LAN=DE A1 Chimenton, Andrea A1 Olivo, Piero PB IOP Publishing YR 2003 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 42 IS Part 1, No. 4B SP 2025 OP 2027 LK http://dx.doi.org/https://doi.org/10.1143/jjap.42.2025 DO https://doi.org/10.1143/jjap.42.2025 SF ELIB - SuUB Bremen
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