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1 Ergebnisse
1
Analysis of Narrow Width Effects in Polycrystalline Silicon..:
Zan, Hsiao-Wen
;
Chang, Ting-Chang
;
Shih, Po-Sheng
...
Japanese Journal of Applied Physics. 42 (2003) Part 1, No. 1 - p. 28-32 , 2003
Link:
https://doi.org/10.1143/jjap.42.28
RT Journal T1 <Title>Analysis of Narrow Width Effects in Polycrystalline Silicon Thin Film Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.42.28&Exemplar=1&LAN=DE A1 Zan, Hsiao-Wen A1 Chang, Ting-Chang A1 Shih, Po-Sheng A1 Peng, Du-Zen A1 Huang, Tiao-Yuan A1 Chang, Chun-Yen PB IOP Publishing YR 2003 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 42 IS Part 1, No. 1 SP 28 OP 32 LK http://dx.doi.org/https://doi.org/10.1143/jjap.42.28 DO https://doi.org/10.1143/jjap.42.28 SF ELIB - SuUB Bremen
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