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Fabrication of Four-Probe Fine Electrodes Using Scanning-Pr..:
Akai, Tomonori
;
Abe, Takumi
;
Shimomura, Takeshi
...
Japanese Journal of Applied Physics. 42 (2003) Part 1, No. 7B - p. 4764-4766 , 2003
Link:
https://doi.org/10.1143/jjap.42.4764
RT Journal T1
Fabrication of Four-Probe Fine Electrodes Using Scanning-Probe Nanofabrication
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.42.4764&Exemplar=1&LAN=DE A1 Akai, Tomonori A1 Abe, Takumi A1 Shimomura, Takeshi A1 Kato, Midori A1 Ishibashi, Masayoshi A1 Heike, Seiji A1 Choi, Byoung-Ki A1 Hashizume, Tomihiro A1 Ito, Kohzo PB IOP Publishing YR 2003 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 42 IS Part 1, No. 7B SP 4764 OP 4766 LK http://dx.doi.org/https://doi.org/10.1143/jjap.42.4764 DO https://doi.org/10.1143/jjap.42.4764 SF ELIB - SuUB Bremen
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