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SnO2Separative Structure Extended Gate H+-Ion Sensitive Fie..:

Chou, Jung-Chuan ; Kwan, Pik-Kwan ; Chen, Zhi-Jie
Japanese Journal of Applied Physics.  42 (2003)  Part 1, No. 11 - p. 6790-6794 , 2003
Link: https://doi.org/10.1143/jjap.42.6790