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Bi-Mode Breakdown Test Methodology of Ultrathin Oxide:

Su, Hung-Der ; Chiou, Bi-Shiou ; Ko, Chin-Yuan...
Japanese Journal of Applied Physics.  42 (2003)  Part 1, No. 12 - p. 7232-7237 , 2003
Link: https://doi.org/10.1143/jjap.42.7232