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Spectroscopy of a Bulk GaN Microcavity Grown on Si(111):
Ollier, Nadège
;
Natali, Franck
;
Byrne, Declan
...
Japanese Journal of Applied Physics. 44 (2005) 7R - p. 4902 , 2005
Link:
https://doi.org/10.1143/jjap.44.4902
RT Journal T1 <Title>Spectroscopy of a Bulk GaN Microcavity Grown on Si(111)</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.44.4902&Exemplar=1&LAN=DE A1 Ollier, Nadège A1 Natali, Franck A1 Byrne, Declan A1 Disseix, Pierre A1 Mihailovic, Martine A1 Vasson, Aimé A1 Leymarie, Joël A1 Semond, Fabrice A1 Massies, Jean PB IOP Publishing YR 2005 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 44 IS 7R SP 4902 LK http://dx.doi.org/https://doi.org/10.1143/jjap.44.4902 DO https://doi.org/10.1143/jjap.44.4902 SF ELIB - SuUB Bremen
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