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1 Ergebnisse
1
Atomic Force Microscope Current-Imaging Study for Current D..:
Salem, Mohamed Ali
;
Mizuta, Hiroshi
;
Oda, Shunri
..
Japanese Journal of Applied Physics. 44 (2004) 1L - p. L88 , 2004
Link:
https://doi.org/10.1143/jjap.44.l88
RT Journal T1
Atomic Force Microscope Current-Imaging Study for Current Density through Nanocrystalline Silicon Dots Embedded in SiO2
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.44.l88&Exemplar=1&LAN=DE A1 Salem, Mohamed Ali A1 Mizuta, Hiroshi A1 Oda, Shunri A1 Fu, Ying A1 Willander, Magnus PB IOP Publishing YR 2004 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 44 IS 1L SP L88 LK http://dx.doi.org/https://doi.org/10.1143/jjap.44.l88 DO https://doi.org/10.1143/jjap.44.l88 SF ELIB - SuUB Bremen
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