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On the Body-Thickness Dependence of the Linearly Extrapolat..:
Wong, Man
;
Shi, Xuejie
;
Chow, Thomas
Japanese Journal of Applied Physics. 45 (2006) 12R - p. 9069 , 2006
Link:
https://doi.org/10.1143/jjap.45.9069
RT Journal T1 <Title>On the Body-Thickness Dependence of the Linearly Extrapolated Threshold Voltage of a Double-Gate Metal–Oxide–Semiconductor Field-Effect Device</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.45.9069&Exemplar=1&LAN=DE A1 Wong, Man A1 Shi, Xuejie A1 Chow, Thomas PB IOP Publishing YR 2006 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 45 IS 12R SP 9069 LK http://dx.doi.org/https://doi.org/10.1143/jjap.45.9069 DO https://doi.org/10.1143/jjap.45.9069 SF ELIB - SuUB Bremen
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