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1 Ergebnisse
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Short Term Frequency Stability Tests of Two Cryogenic Sapph..:
Watabe, Ken-ichi
;
Hartnett, John G.
;
Locke, Clayton R.
...
Japanese Journal of Applied Physics. 45 (2006) 12R - p. 9234 , 2006
Link:
https://doi.org/10.1143/jjap.45.9234
RT Journal T1
Short Term Frequency Stability Tests of Two Cryogenic Sapphire Oscillators
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.45.9234&Exemplar=1&LAN=DE A1 Watabe, Ken-ichi A1 Hartnett, John G. A1 Locke, Clayton R. A1 Santarelli, Giorgio A1 Yanagimachi, Shinya A1 Shimazaki, Takeshi A1 Ikegami, Takeshi A1 Ohshima, Shin-ichi PB IOP Publishing YR 2006 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 45 IS 12R SP 9234 LK http://dx.doi.org/https://doi.org/10.1143/jjap.45.9234 DO https://doi.org/10.1143/jjap.45.9234 SF ELIB - SuUB Bremen
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