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1 Ergebnisse
1
A Robust Silicon-on-Insulator Static-Random-Access-Memory A..:
Hirano, Yuuichi
;
Tsujiuchi, Mikio
;
Ishikawa, Kozo
...
Japanese Journal of Applied Physics. 47 (2008) 4R - p. 2092 , 2008
Link:
https://doi.org/10.1143/jjap.47.2092
RT Journal T1
A Robust Silicon-on-Insulator Static-Random-Access-Memory Architecture by using Advanced Actively Body-Bias Controlled Technology
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.47.2092&Exemplar=1&LAN=DE A1 Hirano, Yuuichi A1 Tsujiuchi, Mikio A1 Ishikawa, Kozo A1 Shinohara, Hirofumi A1 Terada, Takashi A1 Maki, Yukio A1 Iwamatsu, Toshiaki A1 Eikyu, Katsumi A1 Uchida, Tetsuya A1 Obayashi, Shigeki A1 Nii, Koji A1 Tsukamoto, Yasumasa A1 Yabuuchi, Makoto A1 Ipposhi, Takashi A1 Oda, Hidekazu A1 Inoue, Yasuo PB IOP Publishing YR 2008 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 47 IS 4R SP 2092 LK http://dx.doi.org/https://doi.org/10.1143/jjap.47.2092 DO https://doi.org/10.1143/jjap.47.2092 SF ELIB - SuUB Bremen
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