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A Transmission Electron Microscopy Observation of Dislocati..:
Huang, Shih-Yao
;
Yang, Jer-Ren
Japanese Journal of Applied Physics. 47 (2008) 10R - p. 7998 , 2008
Link:
https://doi.org/10.1143/jjap.47.7998
RT Journal T1 <Title>A Transmission Electron Microscopy Observation of Dislocations in GaN Grown on (0001) Sapphire by Metal Organic Chemical Vapor Deposition</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.47.7998&Exemplar=1&LAN=DE A1 Huang, Shih-Yao A1 Yang, Jer-Ren PB IOP Publishing YR 2008 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 47 IS 10R SP 7998 LK http://dx.doi.org/https://doi.org/10.1143/jjap.47.7998 DO https://doi.org/10.1143/jjap.47.7998 SF ELIB - SuUB Bremen
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