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Thermal Creation of Defects in GaTe:
Zubiaga, Asier
;
García, Jose-Angel
;
Plazaola, Fernando
..
Japanese Journal of Applied Physics. 47 (2008) 12R - p. 8719 , 2008
Link:
https://doi.org/10.1143/jjap.47.8719
RT Journal T1 <Title>Thermal Creation of Defects in GaTe</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.47.8719&Exemplar=1&LAN=DE A1 Zubiaga, Asier A1 García, Jose-Angel A1 Plazaola, Fernando A1 Muñoz-Sanjosé, Vicente A1 Martínez-Tomás, Carmen PB IOP Publishing YR 2008 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 47 IS 12R SP 8719 LK http://dx.doi.org/https://doi.org/10.1143/jjap.47.8719 DO https://doi.org/10.1143/jjap.47.8719 SF ELIB - SuUB Bremen
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