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1 Ergebnisse
1
Transmission Electron Microscopy and Atomic Force Microscop..:
Xu, Caixuan
;
Hu, Anming
;
Ichihara, Masaki
...
Japanese Journal of Applied Physics. 48 (2009) 2R - p. 023002 , 2009
Link:
https://doi.org/10.1143/jjap.48.023002
RT Journal T1
Transmission Electron Microscopy and Atomic Force Microscopy Observation of Air-Processed GdBa2Cu3O7-δ Superconductors Doped with Metal Oxide Nanoparticles (Metal = Zr, Zn, and Sn)
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.48.023002&Exemplar=1&LAN=DE A1 Xu, Caixuan A1 Hu, Anming A1 Ichihara, Masaki A1 Izumi, Mitsuru A1 Xu, Yan A1 Sakai, Naomichi A1 Hirabayashi, Izumi PB IOP Publishing YR 2009 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 48 IS 2R SP 023002 LK http://dx.doi.org/https://doi.org/10.1143/jjap.48.023002 DO https://doi.org/10.1143/jjap.48.023002 SF ELIB - SuUB Bremen
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