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1 Ergebnisse
1
Electrical Characterization and Transmission Electron Micro..:
Shiu, Jin-Yu
;
Lu, Chung-Yu
;
Su, Ting-Yi
...
Japanese Journal of Applied Physics. 49 (2010) 2R - p. 021001 , 2010
Link:
https://doi.org/10.1143/jjap.49.021001
RT Journal T1 <Title>Electrical Characterization and Transmission Electron Microscopy Assessment of Isolation of AlGaN/GaN High Electron Mobility Transistors with Oxygen Ion Implantation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.49.021001&Exemplar=1&LAN=DE A1 Shiu, Jin-Yu A1 Lu, Chung-Yu A1 Su, Ting-Yi A1 Huang, Rong-Tan A1 Zirath, Herbert A1 Rorsman, Niklas A1 Chang, Edward Yi PB IOP Publishing YR 2010 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 49 IS 2R SP 021001 LK http://dx.doi.org/https://doi.org/10.1143/jjap.49.021001 DO https://doi.org/10.1143/jjap.49.021001 SF ELIB - SuUB Bremen
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