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1 Ergebnisse
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Measurement of Nonlinear Current–Voltage Dependence of Inte..:
Chen, Zhi Hui
;
Shen, Zhen Kui
;
Jiang, An Quan
Japanese Journal of Applied Physics. 49 (2010) 4R - p. 041503 , 2010
Link:
https://doi.org/10.1143/jjap.49.041503
RT Journal T1
Measurement of Nonlinear Current–Voltage Dependence of Interfacial Passive Layers for Ferroelectric Thin Films
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.49.041503&Exemplar=1&LAN=DE A1 Chen, Zhi Hui A1 Shen, Zhen Kui A1 Jiang, An Quan PB IOP Publishing YR 2010 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 49 IS 4R SP 041503 LK http://dx.doi.org/https://doi.org/10.1143/jjap.49.041503 DO https://doi.org/10.1143/jjap.49.041503 SF ELIB - SuUB Bremen
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