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1 Ergebnisse
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Analysis of Deep-Level Defects on Proton Implanted Polycrys..:
Kim, Won-Sik
;
Kim, Do Hyoung
;
Kwak, Dong Wook
...
Japanese Journal of Applied Physics. 49 (2010) 12R - p. 125802 , 2010
Link:
https://doi.org/10.1143/jjap.49.125802
RT Journal T1
Analysis of Deep-Level Defects on Proton Implanted Polycrystalline Silicon Thin Films Using Photoinduced Current Transient Spectroscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.49.125802&Exemplar=1&LAN=DE A1 Kim, Won-Sik A1 Kim, Do Hyoung A1 Kwak, Dong Wook A1 Lee, Dong Wha A1 Lee, Yeon Hwan A1 Cho, Hoon Young PB IOP Publishing YR 2010 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 49 IS 12R SP 125802 LK http://dx.doi.org/https://doi.org/10.1143/jjap.49.125802 DO https://doi.org/10.1143/jjap.49.125802 SF ELIB - SuUB Bremen
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