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1 Ergebnisse
1
Effect of Channel Layer Thickness on Characteristics and St..:
Kim, Sun-Jae
;
Lee, Soo-Yeon
;
Lee, Young-Wook
...
Japanese Journal of Applied Physics. 50 (2011) 2R - p. 024104 , 2011
Link:
https://doi.org/10.1143/jjap.50.024104
RT Journal T1
Effect of Channel Layer Thickness on Characteristics and Stability of Amorphous Hafnium–Indium–Zinc Oxide Thin Film Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.50.024104&Exemplar=1&LAN=DE A1 Kim, Sun-Jae A1 Lee, Soo-Yeon A1 Lee, Young-Wook A1 Lee, Woo-Geun A1 Yoon, Kap-Soo A1 Kwon, Jang-Yeon A1 Han, Min-Koo PB IOP Publishing YR 2011 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 50 IS 2R SP 024104 LK http://dx.doi.org/https://doi.org/10.1143/jjap.50.024104 DO https://doi.org/10.1143/jjap.50.024104 SF ELIB - SuUB Bremen
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