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Nondestructive Measurement of Nonlinear Conduction of Nanos..:
Nishi, Yuya
;
Hirano, Toshimasa
;
Soh, Yuki
...
Japanese Journal of Applied Physics. 50 (2011) 11R - p. 116602 , 2011
Link:
https://doi.org/10.1143/jjap.50.116602
RT Journal T1 <Title>Nondestructive Measurement of Nonlinear Conduction of Nanoscale Materials, Nanoscale SiO2, and K0.3MoO3 by Pulse Photoconductivity Method</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.50.116602&Exemplar=1&LAN=DE A1 Nishi, Yuya A1 Hirano, Toshimasa A1 Soh, Yuki A1 Kubota, Hiroshi A1 Kobayashi, Kazuhiro A1 Yoshino, Akira A1 Kanayama, Toshihiko PB IOP Publishing YR 2011 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 50 IS 11R SP 116602 LK http://dx.doi.org/https://doi.org/10.1143/jjap.50.116602 DO https://doi.org/10.1143/jjap.50.116602 SF ELIB - SuUB Bremen
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