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1 Ergebnisse
1
In-situ X-ray Photoemission Spectroscopy Study of Atomic La..:
Lee, Seung Youb
;
Jeon, Cheolho
;
Kim, Seok Hwan
...
Japanese Journal of Applied Physics. 51 (2012) 3R - p. 031102 , 2012
Link:
https://doi.org/10.1143/jjap.51.031102
RT Journal T1
In-situ X-ray Photoemission Spectroscopy Study of Atomic Layer Deposition of TiO2 on Silicon Substrate
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.51.031102&Exemplar=1&LAN=DE A1 Lee, Seung Youb A1 Jeon, Cheolho A1 Kim, Seok Hwan A1 Kim, Yooseok A1 Jung, Woosung A1 An, Ki-Seok A1 Park, Chong-Yun PB IOP Publishing YR 2012 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 51 IS 3R SP 031102 LK http://dx.doi.org/https://doi.org/10.1143/jjap.51.031102 DO https://doi.org/10.1143/jjap.51.031102 SF ELIB - SuUB Bremen
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