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1 Ergebnisse
1
Effects of Electron Current and Hole Current on Dielectric ..:
Hirano, Izumi
;
Yamaguchi, Takeshi
;
Nakasaki, Yasushi
...
Japanese Journal of Applied Physics. 51 (2012) 4R - p. 041105 , 2012
Link:
https://doi.org/10.1143/jjap.51.041105
RT Journal T1
Effects of Electron Current and Hole Current on Dielectric Breakdown in HfSiON Gate Stacks
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.51.041105&Exemplar=1&LAN=DE A1 Hirano, Izumi A1 Yamaguchi, Takeshi A1 Nakasaki, Yasushi A1 Iijima, Ryosuke A1 Sekine, Katsuyuki A1 Takayanagi, Mariko A1 Eguchi, Kazuhiro A1 Mitani, Yuichiro PB IOP Publishing YR 2012 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 51 IS 4R SP 041105 LK http://dx.doi.org/https://doi.org/10.1143/jjap.51.041105 DO https://doi.org/10.1143/jjap.51.041105 SF ELIB - SuUB Bremen
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