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1 Ergebnisse
1
Ion-Beam-Induced Luminescence Analysis as Diagnostic Tool f..:
Kada, Wataru
;
Yokoyama, Akihito
;
Koka, Masashi
...
Japanese Journal of Applied Physics. 51 (2012) 6S - p. 06FB07 , 2012
Link:
https://doi.org/10.1143/jjap.51.06fb07
RT Journal T1
Ion-Beam-Induced Luminescence Analysis as Diagnostic Tool for Microstructure Patterning on Diamond by Proton Beam Writing
UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.51.06fb07&Exemplar=1&LAN=DE A1 Kada, Wataru A1 Yokoyama, Akihito A1 Koka, Masashi A1 Takano, Katsuyoshi A1 Satoh, Takahiro A1 Kamiya, Tomihiro PB IOP Publishing YR 2012 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 51 IS 6S SP 06FB07 LK http://dx.doi.org/https://doi.org/10.1143/jjap.51.06fb07 DO https://doi.org/10.1143/jjap.51.06fb07 SF ELIB - SuUB Bremen
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