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Wavelength-Scanning Method for Identifying Vertical Positio..:
Watanabe, Koyo
;
Matsuura, Koji
Japanese Journal of Applied Physics. 51 (2012) 11R - p. 112401 , 2012
Link:
https://doi.org/10.1143/jjap.51.112401
RT Journal T1 <Title>Wavelength-Scanning Method for Identifying Vertical Position of Film Using Surface Plasmon Microscopes</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1143_jjap.51.112401&Exemplar=1&LAN=DE A1 Watanabe, Koyo A1 Matsuura, Koji PB IOP Publishing YR 2012 SN 0021-4922 SN 1347-4065 JF Japanese Journal of Applied Physics VO 51 IS 11R SP 112401 LK http://dx.doi.org/https://doi.org/10.1143/jjap.51.112401 DO https://doi.org/10.1143/jjap.51.112401 SF ELIB - SuUB Bremen
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