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1 Ergebnisse
1
Scan-BIST based on cluster analysis and the encoding of rep..:
Li, Lei
;
Wang, Zhanglei
;
Chakrabarty, Krishnendu
ACM Transactions on Design Automation of Electronic Systems. 12 (2007) 1 - p. 1-21 , 2007
Link:
https://doi.org/10.1145/1188275.1188279
RT Journal T1
Scan-BIST based on cluster analysis and the encoding of repeating sequences
UL https://suche.suub.uni-bremen.de/peid=cr-10.1145_1188275.1188279&Exemplar=1&LAN=DE A1 Li, Lei A1 Wang, Zhanglei A1 Chakrabarty, Krishnendu PB Association for Computing Machinery (ACM) YR 2007 SN 1084-4309 SN 1557-7309 JF ACM Transactions on Design Automation of Electronic Systems VO 12 IS 1 SP 1 OP 21 LK http://dx.doi.org/https://doi.org/10.1145/1188275.1188279 DO https://doi.org/10.1145/1188275.1188279 SF ELIB - SuUB Bremen
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