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Fault Recovery Time Analysis for Coarse-Grained Reconfigura..:
Lee, Ganghee
;
Cetin, Ediz
;
Diessel, Oliver
ACM Transactions on Embedded Computing Systems. 17 (2017) 2 - p. 1-21 , 2017
Link:
https://doi.org/10.1145/3140944
RT Journal T1 <Title>Fault Recovery Time Analysis for Coarse-Grained Reconfigurable Architectures</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1145_3140944&Exemplar=1&LAN=DE A1 Lee, Ganghee A1 Cetin, Ediz A1 Diessel, Oliver PB Association for Computing Machinery (ACM) YR 2017 SN 1539-9087 SN 1558-3465 JF ACM Transactions on Embedded Computing Systems VO 17 IS 2 SP 1 OP 21 LK http://dx.doi.org/https://doi.org/10.1145/3140944 DO https://doi.org/10.1145/3140944 SF ELIB - SuUB Bremen
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