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1 Ergebnisse
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Reliability Hardening Mechanisms in Cyber-Physical Digital-..:
Lu, Guan-Ruei
;
Banerjee, Ansuman
;
Bhattacharya, Bhargab B.
..
ACM Journal on Emerging Technologies in Computing Systems. 14 (2018) 3 - p. 1-22 , 2018
Link:
https://doi.org/10.1145/3229052
RT Journal T1 <Title>Reliability Hardening Mechanisms in Cyber-Physical Digital-Microfluidic Biochips</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1145_3229052&Exemplar=1&LAN=DE A1 Lu, Guan-Ruei A1 Banerjee, Ansuman A1 Bhattacharya, Bhargab B. A1 Ho, Tsung-Yi A1 Chen, Hung-Ming PB Association for Computing Machinery (ACM) YR 2018 SN 1550-4832 SN 1550-4840 JF ACM Journal on Emerging Technologies in Computing Systems VO 14 IS 3 SP 1 OP 22 LK http://dx.doi.org/https://doi.org/10.1145/3229052 DO https://doi.org/10.1145/3229052 SF ELIB - SuUB Bremen
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