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1 Ergebnisse
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Built-in Self-Test and Fault Localization for Inter-Layer V..:
Chaudhuri, Arjun
;
Banerjee, Sanmitra
;
Kim, Jinwoo
...
ACM Journal on Emerging Technologies in Computing Systems. 18 (2021) 1 - p. 1-37 , 2021
Link:
https://doi.org/10.1145/3464430
RT Journal T1 <Title>Built-in Self-Test and Fault Localization for Inter-Layer Vias in Monolithic 3D ICs</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1145_3464430&Exemplar=1&LAN=DE A1 Chaudhuri, Arjun A1 Banerjee, Sanmitra A1 Kim, Jinwoo A1 Park, Heechun A1 Ku, Bon Woong A1 Kannan, Sukeshwar A1 Chakrabarty, Krishnendu A1 Lim, Sung Kyu PB Association for Computing Machinery (ACM) YR 2021 SN 1550-4832 SN 1550-4840 JF ACM Journal on Emerging Technologies in Computing Systems VO 18 IS 1 SP 1 OP 37 LK http://dx.doi.org/https://doi.org/10.1145/3464430 DO https://doi.org/10.1145/3464430 SF ELIB - SuUB Bremen
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