I agree that this site is using cookies. You can find further informations here.
X
Merkliste 
 1 Ergebnisse 
 
1

Defects, Fault Modeling, and Test Development Framework for..:

Fieback, Moritz ; Medeiros, Guilherme Cardoso ; Wu, Lizhou...
ACM Journal on Emerging Technologies in Computing Systems.  18 (2022)  3 - p. 1-26 , 2022
Link: https://doi.org/10.1145/3510851