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A Deep Learning Framework for Solving Stress-based Partial ..:
Hou, Tianshu
;
Zhen, Peining
;
Ji, Zhigang
.
ACM Transactions on Design Automation of Electronic Systems. 28 (2023) 4 - p. 1-20 , 2023
Link:
https://doi.org/10.1145/3567424
RT Journal T1 <Title>A Deep Learning Framework for Solving Stress-based Partial Differential Equations in Electromigration Analysis</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1145_3567424&Exemplar=1&LAN=DE A1 Hou, Tianshu A1 Zhen, Peining A1 Ji, Zhigang A1 Chen, Hai-Bao PB Association for Computing Machinery (ACM) YR 2023 SN 1084-4309 SN 1557-7309 JF ACM Transactions on Design Automation of Electronic Systems VO 28 IS 4 SP 1 OP 20 LK http://dx.doi.org/https://doi.org/10.1145/3567424 DO https://doi.org/10.1145/3567424 SF ELIB - SuUB Bremen
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