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1 Ergebnisse
1
Hot Hole-Induced Device Degradation by Drain Junction Rever..:
Kim, Kwang-Soo
;
Song, Juneui
;
Song, Duheon
.
ECS Transactions. 58 (2014) 16 - p. 23-30 , 2014
Link:
https://doi.org/10.1149/05816.0023ecst
RT Journal T1
Hot Hole-Induced Device Degradation by Drain Junction Reverse Current
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_05816.0023ecst&Exemplar=1&LAN=DE A1 Kim, Kwang-Soo A1 Song, Juneui A1 Song, Duheon A1 Choi, Byoungdeog PB The Electrochemical Society YR 2014 SN 1938-5862 SN 1938-6737 JF ECS Transactions VO 58 IS 16 SP 23 OP 30 LK http://dx.doi.org/https://doi.org/10.1149/05816.0023ecst DO https://doi.org/10.1149/05816.0023ecst SF ELIB - SuUB Bremen
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