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1 Ergebnisse
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Effects of the Bombardment of Negative Oxygen Ions on Gate ..:
Kim, Doohyun
;
Yoon, Soobok
;
Hong, MunPyo
ECS Transactions. 64 (2014) 10 - p. 79-83 , 2014
Link:
https://doi.org/10.1149/06410.0079ecst
RT Journal T1
Effects of the Bombardment of Negative Oxygen Ions on Gate Bias Stability of InGaZnO Thin Film Transistors
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_06410.0079ecst&Exemplar=1&LAN=DE A1 Kim, Doohyun A1 Yoon, Soobok A1 Hong, MunPyo PB The Electrochemical Society YR 2014 SN 1938-5862 SN 1938-6737 JF ECS Transactions VO 64 IS 10 SP 79 OP 83 LK http://dx.doi.org/https://doi.org/10.1149/06410.0079ecst DO https://doi.org/10.1149/06410.0079ecst SF ELIB - SuUB Bremen
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