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1 Ergebnisse
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(Invited) Intrinsic Reliability Assessment of 650V Rated Al..:
Moens, Peter
;
Banerjee, Abhishek
;
Constant, Aurore
...
ECS Transactions. 72 (2016) 4 - p. 65-76 , 2016
Link:
https://doi.org/10.1149/07204.0065ecst
RT Journal T1
(Invited) Intrinsic Reliability Assessment of 650V Rated AlGaN/GaN Based Power Devices: An Industry Perspective
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_07204.0065ecst&Exemplar=1&LAN=DE A1 Moens, Peter A1 Banerjee, Abhishek A1 Constant, Aurore A1 Coppens, Peter A1 Caesar, Markus A1 Li, Zilan A1 Vandeweghe, Steven A1 Declercq, Frederick A1 Padmanabhan, Balaji A1 Jeon, Woochul A1 Guo, Jia A1 Salih, Ali A1 Tack, Marnix A1 Meneghini, Matteo A1 Dalcanale, Stefano A1 Tajilli, A A1 Meneghesso, Gaudenzio A1 Zanoni, Enrico A1 Uren, Mike A1 Chatterjee, Indranil A1 Karboyan, Serge A1 Kuball, Martin PB The Electrochemical Society YR 2016 SN 1938-5862 SN 1938-6737 JF ECS Transactions VO 72 IS 4 SP 65 OP 76 LK http://dx.doi.org/https://doi.org/10.1149/07204.0065ecst DO https://doi.org/10.1149/07204.0065ecst SF ELIB - SuUB Bremen
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