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1 Ergebnisse
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(Invited) Challenges on Surface Conditioning in 3D Device A..:
Veloso, Anabela
;
Paraschiv, Vasile
;
Vecchio, Emma
...
ECS Transactions. 80 (2017) 2 - p. 3-20 , 2017
Link:
https://doi.org/10.1149/08002.0003ecst
RT Journal T1
(Invited) Challenges on Surface Conditioning in 3D Device Architectures: Triple-Gate FinFETs, Gate-All-Around Lateral and Vertical Nanowire FETs
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_08002.0003ecst&Exemplar=1&LAN=DE A1 Veloso, Anabela A1 Paraschiv, Vasile A1 Vecchio, Emma A1 Devriendt, Katia A1 Li, Waikin A1 Simoen, Eddy A1 Chan, B. T. A1 Tao, Zheng A1 Rosseel, Erik A1 Loo, Roger A1 Milenin, Alexey P. A1 Kunert, Bernardette A1 Teugels, Lieve A1 Sebaai, Farid A1 Lorant, Christophe A1 van Dorp, Dennis A1 Altamirano-Sánchez, Efraín A1 Brus, Stephan A1 Marien, Philippe A1 Fleischmann, Claudia A1 Melkonyan, Davit A1 Huynh-Bao, Trong A1 Eneman, Geert A1 Hellings, Geert A1 Sibaja-Hernandez, Arturo A1 Matagne, Philippe A1 Waldron, Niamh A1 Mocuta, Dan A1 Collaert, Nadine PB The Electrochemical Society YR 2017 SN 1938-6737 SN 1938-5862 JF ECS Transactions VO 80 IS 2 SP 3 OP 20 LK http://dx.doi.org/https://doi.org/10.1149/08002.0003ecst DO https://doi.org/10.1149/08002.0003ecst SF ELIB - SuUB Bremen
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