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1 Ergebnisse
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Incomplete Laser Annealing of Ion Doping Damage at Source/D..:
Park, Kee-Chan
;
Nam, Woo-Jin
;
Kang, Su-Hyuk
.
Electrochemical and Solid-State Letters. 7 (2004) 6 - p. G116 , 2004
Link:
https://doi.org/10.1149/1.1695538
RT Journal T1 <Title>Incomplete Laser Annealing of Ion Doping Damage at Source/Drain Junctions of Poly-Si Thin-Film Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.1695538&Exemplar=1&LAN=DE A1 Park, Kee-Chan A1 Nam, Woo-Jin A1 Kang, Su-Hyuk A1 Han, Min-Koo PB The Electrochemical Society YR 2004 SN 1099-0062 JF Electrochemical and Solid-State Letters VO 7 IS 6 SP G116 LK http://dx.doi.org/https://doi.org/10.1149/1.1695538 DO https://doi.org/10.1149/1.1695538 SF ELIB - SuUB Bremen
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