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1 Ergebnisse
1
Transmission Electron Microscopy and Spectroscopic Ellipsom..:
He, Zhiping
;
Cristiano, Filadelfo
;
Zhou, Zuyao
...
Journal of The Electrochemical Society. 143 (1996) 8 - p. 2636-2640 , 1996
Link:
https://doi.org/10.1149/1.1837061
RT Journal T1 <Title>Transmission Electron Microscopy and Spectroscopic Ellipsometry Studies of Damage Layer Induced by Large Tilt Angle Ion Implantation</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.1837061&Exemplar=1&LAN=DE A1 He, Zhiping A1 Cristiano, Filadelfo A1 Zhou, Zuyao A1 Qian, Youhua A1 Chen, Liangyao A1 Lin, Chenglu A1 Hemment, P. L. F. A1 Zou, Shichang PB The Electrochemical Society YR 1996 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 143 IS 8 SP 2636 OP 2640 LK http://dx.doi.org/https://doi.org/10.1149/1.1837061 DO https://doi.org/10.1149/1.1837061 SF ELIB - SuUB Bremen
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