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1 Ergebnisse
1
OI-ELA Poly-Si TFTs for Eliminating Residual Source/Drain J..:
Nam, Woo-Jin
;
Park, Kee-Chan
;
Jung, Sang-Hoon
.
Electrochemical and Solid-State Letters. 8 (2005) 2 - p. G41 , 2005
Link:
https://doi.org/10.1149/1.1846715
RT Journal T1
OI-ELA Poly-Si TFTs for Eliminating Residual Source/Drain Junction Defects
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.1846715&Exemplar=1&LAN=DE A1 Nam, Woo-Jin A1 Park, Kee-Chan A1 Jung, Sang-Hoon A1 Han, Min-Koo PB The Electrochemical Society YR 2005 SN 1099-0062 JF Electrochemical and Solid-State Letters VO 8 IS 2 SP G41 LK http://dx.doi.org/https://doi.org/10.1149/1.1846715 DO https://doi.org/10.1149/1.1846715 SF ELIB - SuUB Bremen
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