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PtSi ‐ Induced Junction Leakage:
Gambino, J. P.
;
Monkowski, M. D.
;
Tsang, P. J.
...
Journal of The Electrochemical Society. 136 (1989) 7 - p. 2063-2067 , 1989
Link:
https://doi.org/10.1149/1.2097168
RT Journal T1 <Title>PtSi ‐ Induced Junction Leakage</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.2097168&Exemplar=1&LAN=DE A1 Gambino, J. P. A1 Monkowski, M. D. A1 Tsang, P. J. A1 Shepard, J. F. A1 Ransom, C. M. A1 Wong, C. Y. PB The Electrochemical Society YR 1989 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 136 IS 7 SP 2063 OP 2067 LK http://dx.doi.org/https://doi.org/10.1149/1.2097168 DO https://doi.org/10.1149/1.2097168 SF ELIB - SuUB Bremen
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