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Avalanche‐Induced Hot Electron Injection and Trapping in Ga..:
Sinha, A. K.
;
Lindenberger, W. S.
;
Powell, W. D.
.
Journal of The Electrochemical Society. 127 (1980) 9 - p. 2046-2049 , 1980
Link:
https://doi.org/10.1149/1.2130063
RT Journal T1 <Title>Avalanche‐Induced Hot Electron Injection and Trapping in Gate Oxides on p‐Si</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.2130063&Exemplar=1&LAN=DE A1 Sinha, A. K. A1 Lindenberger, W. S. A1 Powell, W. D. A1 Povilonis, E. I. PB The Electrochemical Society YR 1980 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 127 IS 9 SP 2046 OP 2049 LK http://dx.doi.org/https://doi.org/10.1149/1.2130063 DO https://doi.org/10.1149/1.2130063 SF ELIB - SuUB Bremen
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