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The Analysis of Anodic Oxide Films on GaAs and GaP by Means..:
Verplanke, J. C.
;
Tijburg, R. P.
Journal of The Electrochemical Society. 124 (1977) 5 - p. 802-804 , 1977
Link:
https://doi.org/10.1149/1.2133410
RT Journal T1 <Title>The Analysis of Anodic Oxide Films on GaAs and GaP by Means of Radioactive Tracer Techniques</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.2133410&Exemplar=1&LAN=DE A1 Verplanke, J. C. A1 Tijburg, R. P. PB The Electrochemical Society YR 1977 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 124 IS 5 SP 802 OP 804 LK http://dx.doi.org/https://doi.org/10.1149/1.2133410 DO https://doi.org/10.1149/1.2133410 SF ELIB - SuUB Bremen
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