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Photochemical Characterization of the Surface Oxide Films o..:
Koubuchi, Yasushi
;
Moribe, Shunji
;
Tanigaki, Yukio
...
Journal of The Electrochemical Society. 139 (1992) 7 - p. 2032-2037 , 1992
Link:
https://doi.org/10.1149/1.2221169
RT Journal T1 <Title>Photochemical Characterization of the Surface Oxide Films of Al‐Pd‐Si and Al‐Si</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.2221169&Exemplar=1&LAN=DE A1 Koubuchi, Yasushi A1 Moribe, Shunji A1 Tanigaki, Yukio A1 Kato, Tokio A1 Inagaki, Masahisa A1 Onuki, Jin PB The Electrochemical Society YR 1992 SN 0013-4651 SN 1945-7111 JF Journal of The Electrochemical Society VO 139 IS 7 SP 2032 OP 2037 LK http://dx.doi.org/https://doi.org/10.1149/1.2221169 DO https://doi.org/10.1149/1.2221169 SF ELIB - SuUB Bremen
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