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Effect of Heat-treatment on Reliability of a-Si:H TFTs for ..:
Nam, Dae-Hyun
;
Jeong, Seong-Hun
;
Lee, Young-Jang
...
ECS Transactions. 16 (2008) 9 - p. 211-215 , 2008
Link:
https://doi.org/10.1149/1.2980554
RT Journal T1
Effect of Heat-treatment on Reliability of a-Si:H TFTs for Integrated Gate Driver Circuits
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.2980554&Exemplar=1&LAN=DE A1 Nam, Dae-Hyun A1 Jeong, Seong-Hun A1 Lee, Young-Jang A1 Jo, Sung-Hak A1 Kim, Do-Sung A1 Moon, Hong-Man A1 Shin, Hyun-Ho A1 Chung, In-Jae PB The Electrochemical Society YR 2008 SN 1938-5862 SN 1938-6737 JF ECS Transactions VO 16 IS 9 SP 211 OP 215 LK http://dx.doi.org/https://doi.org/10.1149/1.2980554 DO https://doi.org/10.1149/1.2980554 SF ELIB - SuUB Bremen
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