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1 Ergebnisse
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Interfacial Dipole Measurement of Dielectric/Silicon Interf..:
Kakushima, Kuniyuki
;
Okamoto, Kouichi
;
Tachi, Kiichi
...
ECS Transactions. 16 (2009) 21 - p. 11-15 , 2009
Link:
https://doi.org/10.1149/1.3100622
RT Journal T1
Interfacial Dipole Measurement of Dielectric/Silicon Interface by X-ray Photoelectron Spectroscopy
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.3100622&Exemplar=1&LAN=DE A1 Kakushima, Kuniyuki A1 Okamoto, Kouichi A1 Tachi, Kiichi A1 Sato, Soushi A1 Song, Jaeyeol A1 Kawanago, Takamasa A1 Ahmet, Parhat A1 Sugii, Nobuyuki A1 Tsutsui, Kazuo A1 Hattori, Takeo A1 Iwai, H. PB The Electrochemical Society YR 2009 SN 1938-5862 SN 1938-6737 JF ECS Transactions VO 16 IS 21 SP 11 OP 15 LK http://dx.doi.org/https://doi.org/10.1149/1.3100622 DO https://doi.org/10.1149/1.3100622 SF ELIB - SuUB Bremen
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