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The Impact of Device Configuration on the Photon-Enhanced N..:
Kwon, Jang-Yeon
;
Son, Kyoung Seok
;
Jung, Ji Sim
...
Electrochemical and Solid-State Letters. 13 (2010) 6 - p. H213 , 2010
Link:
https://doi.org/10.1149/1.3381023
RT Journal T1 <Title>The Impact of Device Configuration on the Photon-Enhanced Negative Bias Thermal Instability of GaInZnO Thin Film Transistors</Title> UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.3381023&Exemplar=1&LAN=DE A1 Kwon, Jang-Yeon A1 Son, Kyoung Seok A1 Jung, Ji Sim A1 Lee, Kwang-Hee A1 Park, Joon Seok A1 Kim, Tae Sang A1 Ji, Kwang Hwan A1 Choi, Rino A1 Jeong, Jae Kyeong A1 Koo, Bonwon A1 Lee, Sangyun PB The Electrochemical Society YR 2010 SN 1099-0062 JF Electrochemical and Solid-State Letters VO 13 IS 6 SP H213 LK http://dx.doi.org/https://doi.org/10.1149/1.3381023 DO https://doi.org/10.1149/1.3381023 SF ELIB - SuUB Bremen
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