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1 Ergebnisse
1
Resistive Switching Behavior in the Ru∕Y[sub 2]O[sub 3]∕TaN..:
Pan, Tung-Ming
;
Chen, Kai-Ming
;
Lu, Chih-Hung
Electrochemical and Solid-State Letters. 14 (2011) 1 - p. H27 , 2011
Link:
https://doi.org/10.1149/1.3509144
RT Journal T1
Resistive Switching Behavior in the Ru∕Y[sub 2]O[sub 3]∕TaN Nonvolatile Memory Device
UL https://suche.suub.uni-bremen.de/peid=cr-10.1149_1.3509144&Exemplar=1&LAN=DE A1 Pan, Tung-Ming A1 Chen, Kai-Ming A1 Lu, Chih-Hung PB The Electrochemical Society YR 2011 SN 1099-0062 JF Electrochemical and Solid-State Letters VO 14 IS 1 SP H27 LK http://dx.doi.org/https://doi.org/10.1149/1.3509144 DO https://doi.org/10.1149/1.3509144 SF ELIB - SuUB Bremen
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